The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Jan. 31, 2020
Element Ai Inc., Montreal, CA;
Frédéric Branchaud-Charron, Montreal, CA;
Parmida Atighehchian, Montreal, CA;
Jan Freyberg, Montreal, CA;
Lorne Schell, Montreal, CA;
SERVICENOW CANADA INC., Montreal, CA;
Abstract
A method and server for optimizing hyperparameter tuples for training production-grade artificial intelligence (AI) models. For each one of the AI models, AI model features are extracted and, for the one AI model, an initial distribution of n hyperparameter tuplesis created considering the extracted AI model features therefor. A loop is repeated, until metric parameters are satisfied, comprising: evaluating latency from training the one AI model for each of the n hyperparameters tuples; evaluating model uncertainty from training the one AI model for each of the n hyperparameters tuples; for each of the n hyperparameters tuples, computing a blended quality measurement from the evaluated latency and evaluated model uncertainty; replacing m hyperparameter tuples having the worst blended quality measurements with m newly generated hyperparameter tuples. The metric parameters include one or more of a threshold value on model uncertainty and blended quality measurement gain between successive loops.