The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Jan. 02, 2020
Method and system for minimizing impact of faulty nodes associated with an artificial neural network
Applicant:
Wipro Limited, Bangalore, IN;
Inventor:
Manjunath Ramachandra Iyer, Bangalore, IN;
Assignee:
Wipro Limited, Bangalore, IN;
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06N 3/063 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01); G06N 3/063 (2013.01);
Abstract
A technique is provided for minimizing impact of a faulty node associated with an artificial network. The technique includes detecting a faulty node associated with the artificial neural network. The faulty node causes a faulty path in the artificial neural network. Further, a plurality of alternate paths are identified to reroute the faulty path. Based on the identified plurality of alternate paths, the faulty path is rerouted by assigning one or more weights associated with the faulty node to one or more nodes associated with the plurality of alternate paths.