The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Dec. 01, 2020
Applicant:

National Applied Research Laboratories, Taipei, TW;

Inventors:

Hsi-Ching Lin, Hsinchu, TW;

Yu-Shao Liu, Hsinchu, TW;

August Chao, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/62 (2013.01); H04L 9/14 (2006.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
G06F 21/6227 (2013.01); H04L 9/14 (2013.01); H04L 63/123 (2013.01);
Abstract

The present application is related to system and method for analyzing confidential data. Firstly, a first key is used to obtain a first analysis authorization for proceeding a first analysis responsive to an operational model in an encrypted cloud space with a connection of a network. Then, the result of the first analysis is verified. While the verifying of the operational model is pass, a second key is used to obtain a second analysis authorization for proceeding a second analysis responsive to an operational model without the connection of the network. Thereby, the cloud technique for analyzing data can be applied for analyzing confidential data.


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Lin, Hsi-Ching. (2022). System and method for analyzing confidential data (U.S. Patent No. 11537739). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11537739

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