The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
May. 17, 2022
Split Software, Inc., Redwood City, CA (US);
Elizabeth Eardley, Scotland, GB;
Patricio Echagüe, Redwood City, CA (US);
SPLIT SOFTWARE, INC., Redwood City, CA (US);
Abstract
A method and apparatus for configurable application feature experiments is described. The method may include receiving a set of metrics to be collected after a feature treatment is deployed to configurable applications executed by a plurality of end user systems, a significance threshold for detection of feature treatment impact on one or more metrics within the set of metrics, and a request to perform multiple comparison correction when detecting the feature treatment impact. The method may also include receiving, from the configurable applications, event messages that include metric values associated with the set of metrics. Further, the method may also include performing a statistical analysis of the metric values to determine whether the feature treatment caused a statistically significant change in values associated with one or more of the metrics, where the statistical analysis adjusts one or more parameters used to perform the statistical analysis based on a multiple comparison correction analysis.