The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Oct. 20, 2021
China University of Mining & Technology, Beijing, Beijing, CN;
Peng Lin, Beijing, CN;
Jingtao Zhao, Beijing, CN;
Suping Peng, Beijing, CN;
Xiaoqin Cui, Beijing, CN;
CHINA UNIVERSITY OF MINING & TECHNOLOGY, BEIJING, Beijing, CN;
Abstract
The present disclosure provides a diffracted wave imaging method, device and electronic apparatus. The method comprises: acquiring pre-stack seismic wave field data of a to-be-processed area; extracting target data of a target imaging point; fitting target time sample points in the target data based on the Gaussian model and solving the fitting function to determine a distribution range of the stationary point position signal of the reflected wave in the target data; determining migration imaging data of the target imaging point based on the target data and the distribution range; and determining a diffracted wave imaging result of the to-be-processed area based on the migration imaging data of all the imaging points in the to-be-processed area.