The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

May. 15, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G01S 5/00 (2006.01); G01S 17/06 (2006.01); G01S 7/497 (2006.01); G01S 7/4915 (2020.01); G01S 17/89 (2020.01); G01S 17/32 (2020.01); G01S 17/10 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4915 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01);
Abstract

A distance measuring apparatus includes a reference object distance calculation section which calculates a distance to a reference object based on a two-dimensional image in which the reference object, which includes a plurality of feature points having obvious three-dimensional coordinate correlations, is captured, and a correction amount calculation section which calculates a correction amount for correcting a distance image by comparing the calculated distance to the reference object with a distance measurement value to the reference object in the distance image.


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