The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Nov. 29, 2021
Keysight Technologies, Inc., Santa Rosa, CA (US);
Steven D. Draving, Colorado Springs, CO (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A method and system measure a characteristic of a signal under test (SUT) using a signal measurement device. The method includes receiving the SUT through first and second input channels; digitizing first and second copies of the SUT to obtain first and second digitized waveforms; repeatedly determining first and second measurement trends to obtain measurement trend pairs; cross-correlating the first and second measurement trends in each measurement trend pair to obtain cross-correlation vectors; extracting zero-displacement values from the cross-correlation vectors, respectively; summing the zero-displacement values to obtain a sum of measurement products for the measurement trend pairs; divide the sum of zero-displacement values by a total number of measurement products to obtain an average value of the measurement products, corresponding to MSV of the measured SUT characteristic; and determining a square root of the average value of the MSV to obtain an RMS value of the measured SUT characteristic.