The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Jun. 02, 2017
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Tetsu Ogawa, Tokyo, JP;

Masatoshi Takashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01N 21/55 (2014.01); A01G 7/00 (2006.01); G01N 21/75 (2006.01); G01N 33/00 (2006.01); G01N 21/47 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); A01G 7/00 (2013.01); G01N 21/47 (2013.01); G01N 21/75 (2013.01); G01N 33/0098 (2013.01); G01N 2021/1789 (2013.01); G01N 2201/123 (2013.01);
Abstract

The present technology relates to an information processing device capable of obtaining an index effective for a measurement target as an index related to light incident on the measurement target, an information processing method, and a program. The information processing device can obtain an index effective for a measurement target as an index regarding light incident on the measurement target by calculating an effective index representing the degree of light effectively utilized for the measurement target in incident light as an index regarding the light incident on the measurement target, on the basis of a measured value regarding the measurement target which is obtained by sensing performed by a sensor. The present technology can be applied to, for example, an apparatus calculating an index of plants.


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