The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Mar. 31, 2020
Toyota Research Institute, Inc., Los Altos, CA (US);
Alexander Alspach, Somerville, MA (US);
Naveen Suresh Kuppuswamy, Arlington, MA (US);
Avinash Uttamchandani, Cambridge, MA (US);
Toyota Research Institute, Inc., Los Altos, CA (US);
Abstract
A system for calibrating a deformable sensor is provided. The system includes a deformable sensor including a housing, a deformable membrane coupled to an upper portion of the housing, and an enclosure defined by the housing and the deformable member; an imaging sensor configured to capture an image of the deformable membrane of the deformable sensor; and a controller. The enclosure is configured to be filled with a medium. The controller is configured to: receive the image of the deformable membrane of the deformable sensor; determine whether a contour of the deformable membrane in the image of the deformable membrane of the deformable sensor corresponds to a predetermined contour; and adjust a volume of the medium in the enclosure of the deformable sensor in response to the determination that the contour of the deformable membrane is different from the predetermined contour.