The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Aug. 07, 2018
Commonwealth Scientific and Industrial Research Organisation, Acton, AU;
Abstract
Described herein is a device () for measuring parameters of a material () flowing along a passage (), the passage having two longitudinally spaced apart ends and transverse sides defined by one or more sidewalls (). The device () includes a laser source () positioned at a first location within or adjacent a side of the passage () and configured to generate a laser beam () at one or more predetermined frequencies. A beam projection element () projects the laser beam () transversely across the passage () to irradiate the material () within a measuring zone (). The measuring zone () includes a transverse region extending greater than 50% of the width of the passage (). An optical imaging device () is positioned at a second location within or adjacent the passage () and configured to capture images of backscattered light from material () within the measuring zone (). A processor () is in communication with the optical imaging device () and is configured to process the captured images and perform a scattering analysis to determine parameters of the material () through the passage ().