The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Mar. 11, 2019
Fujifilm Corporation, Tokyo, JP;
Shinichiro Sonoda, Kanagawa, JP;
Takeichi Tatsuta, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a measurement support device, an endoscope system, a processor for an endoscope system, and a measurement support method capable of easily and highly accurately measuring the size of a subject. In the measurement support device related to one aspect of the invention, the position of a spot by measurement auxiliary light is measured, and information indicating the actual size of a subject is acquired on the basis of the measurement result to create and display a marker. Moreover, an optical axis of the measurement auxiliary light has an inclination angle that is not 0 degrees with respect to an optical axis of the imaging optical system in a case where the optical axis of the measurement auxiliary light is projected on a plane including the optical axis of the imaging optical system.