The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Oct. 29, 2020
Applicant:

Mitsui Chemicals Tohcello, Inc., Tokyo, JP;

Inventor:

Eiji Hayashishita, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); C09J 7/25 (2018.01); C09J 201/00 (2006.01); C09J 7/20 (2018.01); C09J 7/30 (2018.01); C09J 133/08 (2006.01); C09J 133/12 (2006.01); H01L 21/683 (2006.01); H01L 21/78 (2006.01);
U.S. Cl.
CPC ...
C09J 7/255 (2018.01); C09J 7/20 (2018.01); C09J 7/25 (2018.01); C09J 7/30 (2018.01); C09J 133/08 (2013.01); C09J 133/12 (2013.01); C09J 201/00 (2013.01); H01L 21/6836 (2013.01); H01L 21/78 (2013.01); C09J 2203/326 (2013.01); C09J 2301/502 (2020.08); C09J 2433/00 (2013.01); C09J 2467/006 (2013.01); C09J 2477/006 (2013.01);
Abstract

Provided is a film for manufacturing a semiconductor part in which an evaluation step accompanied with a temperature change, a segmenting step, and a pickup step can be commonly performed, a method for manufacturing a semiconductor part, a semiconductor part, and an evaluation method. The film includes a base layer, and an adhesive layer disposed on one surface side of the base layer, wherein the ratio RE (=E'(160)/E′(−40)) of the elastic modulus of the base layer at 160° C. to the elastic modulus of the base layer at −40° C. is RE≥0.01, and the elastic modulus E′(−40) is 10 MPa to less than 1000 MPa. The method includes bonding the adhesive layer to a back surface of a semiconductor wafer, separating the semiconductor wafer into segments to obtain semiconductor parts, and separating the semiconductor parts from the adhesive layer, and includes a step of evaluating.


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