The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Oct. 27, 2020
Applicant:

Empa Eidgenössische Materialprüfungs- Und Forschungsanstalt, Dübendorf, CH;

Inventors:

Kilian Wasmer, Choex, CH;

Sergey Shevchik, Zürich, CH;

Farzad Vakili Farahani, Rüfenacht, CH;

Georgios Violakis, Thun, CH;

Sébastien Vaucher, Thun, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B22F 3/105 (2006.01); B29C 64/153 (2017.01); G01D 5/353 (2006.01); G01N 29/12 (2006.01); G01N 29/14 (2006.01); G01N 29/24 (2006.01); B22F 10/20 (2021.01); B22F 10/00 (2021.01); B33Y 30/00 (2015.01); B22F 10/30 (2021.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B22F 10/00 (2021.01); B22F 10/20 (2021.01); B29C 64/153 (2017.08); G01D 5/35354 (2013.01); G01N 29/12 (2013.01); G01N 29/14 (2013.01); G01N 29/2418 (2013.01); B22F 10/10 (2021.01); B22F 10/30 (2021.01); B22F 2999/00 (2013.01); B33Y 30/00 (2014.12);
Abstract

Use of a sensor read out system with at least one fiber optical sensor, which is connected via at least one signal line to a processing unit as part of an additive manufacturing setup, for in situ and real time quality control of a running additive manufacturing process. Acoustic emission is measured via the at least one fiber optical sensor in form of fibers with Bragg grating, fibre interferometer or Fabry-Perot structure, followed by a signal transfer and an analysis of the measured signals in the processing unit, estimation of the sintering or melting process quality due to correlation between sintering or melting quality and measured acoustic emission signals and subsequent adaption of ion and electron beams, microwave or laser sintering or melting parameters of a ion and electron beams, microwave or laser electronics of the additive manufacturing setup in real times via a feedback loop as a result of the measured acoustic emission signals after interpretation with an algorithmic framework in the processing unit.


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