The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Feb. 08, 2021
Applicant:
Ipg Photonics Corporation, Oxford, MA (US);
Inventors:
Assignee:
IPG PHOTONICS CORPORATION, Oxford, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01); B23K 26/20 (2014.01); B23K 26/348 (2014.01); A61B 18/20 (2006.01); G01J 3/453 (2006.01); B23K 26/361 (2014.01); G01N 21/84 (2006.01); B23K 9/095 (2006.01); B23K 15/00 (2006.01); B23K 15/02 (2006.01); G01B 9/02015 (2022.01); G01B 11/22 (2006.01); B33Y 30/00 (2015.01); B23K 26/382 (2014.01); B23K 15/08 (2006.01); B23K 26/362 (2014.01); C21D 10/00 (2006.01); C22F 3/00 (2006.01); B29C 64/153 (2017.01); B23K 103/00 (2006.01); A61B 17/00 (2006.01); A61B 18/00 (2006.01); B22F 10/30 (2021.01); B22F 10/10 (2021.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); A61B 18/20 (2013.01); B23K 9/0956 (2013.01); B23K 15/0013 (2013.01); B23K 15/02 (2013.01); B23K 15/08 (2013.01); B23K 15/085 (2013.01); B23K 26/03 (2013.01); B23K 26/20 (2013.01); B23K 26/348 (2015.10); B23K 26/361 (2015.10); B23K 26/362 (2013.01); B23K 26/382 (2015.10); B29C 64/153 (2017.08); B33Y 30/00 (2014.12); C21D 10/00 (2013.01); C22F 3/00 (2013.01); G01B 9/0203 (2013.01); G01B 11/22 (2013.01); G01J 3/453 (2013.01); G01N 21/84 (2013.01); A61B 2017/00057 (2013.01); A61B 2018/00642 (2013.01); B22F 10/10 (2021.01); B22F 10/30 (2021.01); B23K 2103/42 (2018.08); B23K 2103/52 (2018.08); G01N 2021/8416 (2013.01);
Abstract
Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.