The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Jan. 16, 2019
Applicant:

Cataler Corporation, Kakegawa, JP;

Inventor:

Hiroki Nihashi, Kakegawa, JP;

Assignee:

CATALER CORPORATION, Kakegawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 23/46 (2006.01); B01J 21/04 (2006.01); B01J 35/02 (2006.01); B01J 35/00 (2006.01); B01J 37/02 (2006.01); B01J 37/08 (2006.01); B01D 53/94 (2006.01); F01N 3/28 (2006.01);
U.S. Cl.
CPC ...
B01J 23/464 (2013.01); B01D 53/94 (2013.01); B01J 21/04 (2013.01); B01J 35/0013 (2013.01); B01J 35/026 (2013.01); B01J 37/0219 (2013.01); B01J 37/0221 (2013.01); B01J 37/086 (2013.01); F01N 3/2803 (2013.01); B01D 2255/1023 (2013.01); B01D 2255/1025 (2013.01); F01N 2330/02 (2013.01); F01N 2370/02 (2013.01); F01N 2510/06 (2013.01);
Abstract

An exhaust gas purification catalyst including particles of a catalyst metal supported on secondary particles of an inorganic oxide, wherein when scanning transmission electron microscope-energy dispersive X-ray line analysis is performed from a surface of the secondary particles toward a center thereof, a support density of the catalyst metal on a surface side of the secondary particles is greater than the support density of the catalyst metal in a center part of the secondary particles.


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