The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Mar. 19, 2020
Keio University, Tokyo, JP;
Kose Corporation, Tokyo, JP;
Hiroshi Kawasaki, Tokyo, JP;
Eiryo Kawakami, Tokyo, JP;
Keita Koseki, Tokyo, JP;
Tamotsu Ebihara, Tokyo, JP;
Masayuki Amagai, Tokyo, JP;
Eiji Naru, Tokyo, JP;
Makoto Mizuno, Tokyo, JP;
Miki Ito, Tokyo, JP;
Toru Atsugi, Tokyo, JP;
Yukako Kimura, Tokyo, JP;
KEIO UNIVERSITY, Tokyo, JP;
KOSE Corporation, Tokyo, JP;
Abstract
An estimation method for estimating a parameter related to skin function is provided. The estimation method includes an image acquisition step for acquiring a skin image in which unevenness of a skin surface is captured; an extraction step for extracting a feature vector based on topological information on the skin image from the skin image acquired in the image acquisition step; an estimation step for estimating the parameter related to skin function based on the feature vector extracted in the extraction step, using an estimation model constructed based on past actual measurement data in which feature vectors are associated with the parameter related to skin function; and a presentation step for presenting the parameter related to skin function estimated in the estimation step.