The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Sep. 27, 2019
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Michihiro Takii, Aichi, JP;

Yukito Hirayama, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/02 (2006.01); A61B 3/103 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0016 (2013.01); A61B 3/02 (2013.01); A61B 3/12 (2013.01); A61B 3/103 (2013.01);
Abstract

A subjective optometry apparatus includes an optometry unit having an optical member, being located in front of a subject eye, and changing optical characteristics of a target light flus with using the optical member, and a measurement optical system that has a light projecting optical system for applying measurement light emitted from a measurement light source to a fundus of the subject eye through the optometry unit, and a light receiving optical system in which a detector receives reflected light of the measurement light reflected on the fundus of the subject eye through the optometry unit, and that objectively measures the optical characteristics of the subject eye. An optical axis of the measurement optical system is set to be off-axis from an optical axis of the optical member in the optometry unit.


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