The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Nov. 24, 2020
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventor:

Wael Al-Qaq, Oak Ridge, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/21 (2015.01); H04L 7/033 (2006.01);
U.S. Cl.
CPC ...
H04B 17/12 (2015.01); H04B 17/21 (2015.01); H04L 7/0331 (2013.01);
Abstract

Techniques are presented to improve the accuracy of and reduce the time required for calibration of an in-phase/quadrature (I/Q) transmission circuit. A measurement receiver measures the I/Q mismatch, where an RF phase shift is introduced to distinguish between the transmitter and measurement receiver I/Q mismatches. Rather than assuming an amount of introduced phase shift, a measurement is used to estimate the phase shift. This phase estimate is then used to determine and correct the I/Q mismatch in the transmitter and measurement receiver. An iterative process can be used to improve the I/Q correction factors. Using simple signal processing to measure the phase shift during calibration and to perform the image calibration calculations, the phase shifter requirements can be significantly relaxed, resulting in faster design time and reduced design area/cost. This approach results in reduced calibration time, thus contributing to reduced factory production time and enabling faster live mode image calibration.


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