The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Jul. 07, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Plamen Vassilev Kolev, San Diego, CA (US);

Anil Kumar Vemulapalli, Milpitas, CA (US);

Matthew Deig, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/64 (2006.01); H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 23/00 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 23/642 (2013.01); H01L 21/84 (2013.01); H01L 23/562 (2013.01); H01L 27/1203 (2013.01); H01L 27/12 (2013.01); H01L 29/6659 (2013.01);
Abstract

Vertically-aligned and conductive dummies in integrated circuit (IC) layers reduce capacitance and bias independence. Dummies are islands of material in areas of metal and semiconductor IC layers without circuit features to avoid non-uniform polishing ('dishing'). Conductive diffusion layer dummies in a diffusion layer and conductive polysilicon dummies in a polysilicon layer above the diffusion layer reduce bias dependence and nonlinear circuit operation in the presence of an applied varying voltage. ICs with metal dummies vertically aligned in at least one metal layer above the polysilicon dummies and diffusion dummies reduce lateral coupling capacitance compared to ICs in which dummies are dispersed in a non-overlapping layout by a foundry layout tool. Avoiding lateral resistance-capacitance (RC) ladder networks created by dispersed dummies improves signal delays and power consumption in radio-frequency (RF) ICs.


Find Patent Forward Citations

Kolev, Plamen. (2022). Vertically-aligned and conductive dummies in integrated circuit layers for capacitance reduction and bias independence and methods of manufacture (U.S. Patent No. 11532571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11532571

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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