The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Jul. 16, 2021
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Kai-Niklas Bastian, Malsch, DE;

Hinnerk Gildhoff, Neckargemünd, DE;

Tim Grouisborn, Mannheim, DE;

Michael Jung, Angelbachtal, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/10 (2006.01); G06T 17/20 (2006.01); G06F 7/08 (2006.01);
U.S. Cl.
CPC ...
G06T 17/10 (2013.01); G06F 7/08 (2013.01); G06T 17/20 (2013.01); G06T 17/205 (2013.01); G06T 2210/56 (2013.01);
Abstract

Some embodiments provide a non-transitory machine-readable medium that stores a program. The program receives, from a client device, a percentage value for a set of points. The program further determines a triangulation based on the set of points. The program also determines an alpha value based on the triangulation and the percentage value. The program further determines an alpha shape based on the alpha value. The program also provides the client device the alpha shape.


Find Patent Forward Citations

Bastian, Kai-Niklas. (2022). System and method for determining alpha values for alpha shapes (U.S. Patent No. 11532126). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11532126

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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