The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Nov. 03, 2020
Applicant:

Echonous, Inc., Redmond, WA (US);

Inventors:

Babajide Ayinde, Redmond, WA (US);

Eric Wong, Seattle, WA (US);

Allen Lu, Seattle, WA (US);

Assignee:

ECHONOUS, INC., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/00 (2017.01); G06K 9/62 (2022.01); G06N 20/20 (2019.01); G06V 10/25 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06K 9/6262 (2013.01); G06N 20/20 (2019.01); G06T 7/13 (2017.01); G06V 10/25 (2022.01); G06V 10/751 (2022.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06V 2201/031 (2022.01);
Abstract

A facility for processing a medical imaging image is described. The facility applies each of a number of constituent models making up an ensemble machine learning models to the image to produce a constituent model result that predicts a value for each pixel of the image. The facility aggregates the results produced by the constituent models of the plurality to determine a result of the ensemble machine learning model. For each of the pixels of the accessed image, the facility determines a measure of variation among the values predicted for the pixel among the constituent models. Facility determines a confidence measure for the ensemble machine learning model result based at least in part on for how many of the pixels of the accessed image a variation measure is determined that exceeds a variation threshold.


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