The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Apr. 27, 2020
Raytheon Technologies Corporation, Farmington, CT (US);
Masoud Anahid, Simsbury, CT (US);
Tahany Ibrahim El-Wardany, Vernon, CT (US);
Sergei F. Burlatsky, West Hartford, CT (US);
William K. Tredway, Manchester, CT (US);
Raytheon Technologies Corporation, Farmington, CT (US);
Abstract
A method of evaluating an additive manufacturing process includes receiving a set of additive manufacturing parameters and an additive manufacturing part design at an analysis module, receiving a set of random values at the analysis module, determining a probability distribution of stochastic flaws within a resultant additively manufactured article using at least one multidimensional space physics model, and categorizing the additive manufacturing part design as defect free when the probability distribution is below a predefined threshold. Each value in the set of random values corresponds to a distinct variable in a set of variables. Each variable in the set of variables at least partially defines at least one of an uncontrolled additive manufacturing parameter and an uncontrollable additive manufacturing parameter.