The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Aug. 21, 2020
Applicant:

Siemens Industry, Inc., Alpharetta, GA (US);

Inventors:

Donal O'Farrell, Vienna, AT;

Zhen Song, Austin, TX (US);

Megan McHugh, Pflugerville, TX (US);

Alexander Guiterrez, Austin, TX (US);

Assignee:

Siemens Industry, Inc., Alpharetta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G05B 19/042 (2013.01); G05B 2219/25011 (2013.01);
Abstract

Methods for data quality analysis and aggregation in a building automation system and corresponding systems and computer-readable mediums. A method includes receiving input data and receiving a configuration file that defines data quality (DQ) processes to be performed on the input data. The method includes dynamically building a configurable pipeline based on the configuration file, the pipeline including one or more Data Quality Indicator (DQI) or Data Quality Aggregation (DQA) process components from a DQ core library. The method includes performing DQ processes on the input data, including executing each of the DQI or DQA process components included in the pipeline, producing one or more DQ results based on the DQ processes, and returning the one or more DQ results.


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