The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Feb. 27, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takayuki Uchida, Tokyo, JP;

Tomoaki Hiruta, Tokyo, JP;

Toshiaki Kono, Tokyo, JP;

Yasuharu Namba, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/18 (2006.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06F 16/9027 (2019.01); G06F 17/18 (2013.01);
Abstract

The invention provides a maintenance recommendation system in which an inspection item is presented timely in the halfway of an inspection, accuracy of failure mode identification is improved, a failure mode is identified at an early stage, meanwhile, a time required for investigating a content of the failure is reduced, and a time from device failure to reset is shortened. The maintenance recommendation system includes: a primary storage unit that stores an input inspection result; a failure mode probability calculation unit that is configured to calculate a probability of a failure mode based on the inspection result stored in the primary storage unit; an inspection item search unit that is configured to extract an inspection item with the minimum inspection score from uninspected inspection items; and a main routine operation unit that is configured to narrow down a failure mode candidate and an inspection item candidate from all inspection items.


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