The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Jul. 10, 2020
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventor:
Keita Hada, Yamanashi, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 23/0218 (2013.01); G06N 20/00 (2019.01);
Abstract
An abnormality determination device acquires observation data observed during an operation of an industrial machine, extracts partial time-series data, including a portion representative of a feature of an operating state at a specified timing, from the observation data, calculates a statistical amount from the extracted partial time-series data, and performs processing for machine learning related to determination of operation abnormality of the industrial machine, based on the calculated statistical amount.