The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Apr. 09, 2021
Applicant:
Cognex Corporation, Natick, MA (US);
Inventors:
Assignee:
COGNEX CORPORATION, Natick, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/133 (2006.01); G06T 7/00 (2017.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G02F 1/13306 (2013.01); G06T 7/0004 (2013.01); H04N 5/2256 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract
Disclosed is a defect inspection device for determining anomaly of an inspection object. The defect inspection device may include: a lighting system which includes a light source for transmitting light onto the inspection object; and a dynamic diffuser located between the light source and the inspection object and capable of controlling a diffusivity of light transmitted onto the inspection object; and one or more processors for controlling the dynamic diffuser based on characteristics of the inspection object.
Song, Kiyoung. (2022). Optic system using dynamic diffuser (U.S. Patent No. 11531220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11531220
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile