The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Mar. 07, 2017
Applicant:

The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);

Inventors:

Eric Hoke, Somerville, MA (US);

Jeffrey Korn, Lexington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G06N 20/00 (2019.01); G02B 7/182 (2021.01);
U.S. Cl.
CPC ...
G02B 26/0833 (2013.01); G02B 7/182 (2013.01); G06N 20/00 (2019.01); G02B 2207/129 (2013.01);
Abstract

A bijective coded aperture system uses mirror system with a multitude of reflector elements attached to an absorbing, such as black, substrate. Each of the reflector elements is independently placed at a different angle with respect to each other in such a manner that the image of the scene is replicated several times at the focal plane and on the image sensor. Moreover, these replicated images may be overlapping. An image processor can then execute reconstruction methods of the image to faithfully represent the scene.


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