The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Jan. 22, 2021
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Alois Regensburger, Poxdorf, DE;

Susanne Kohlhammer, Blaustein, DE;

Jonathan Essig, Neresheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/0072 (2013.01); G02B 21/367 (2013.01);
Abstract

A microscope includes an illumination unit for illuminating a region of a specimen to generate an illuminated region, an imaging optical unit for magnified imaging of the illuminated region, an image sensor disposed downstream of the imaging optical unit for capturing the magnified image of the illuminated region, a camera for recording an overview region of the specimen without using the imaging optical unit and a control unit for controlling the image sensor and the camera. The overview region includes a part of the illuminated region and a non-illuminated region of the specimen. The control unit actuates the camera to make a recording of the overview region. The control unit actuates the image sensor to cause a recordation of the magnified image of the illuminated region. The control unit generates an overview image based on the recording of the overview region and the recording of the magnified image.


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