The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Jul. 21, 2017
Applicant:
Northwestern University, Evanston, IL (US);
Inventors:
Mercouri G. Kanatzidis, Wilmette, IL (US);
Bruce W. Wessels, Wilmette, IL (US);
Zhifu Liu, Wilmette, IL (US);
Wenwen Lin, Evanston, IL (US);
Assignee:
NORTHWESTERN UNIVERSITY, Evanston, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G01T 1/24 (2006.01); H01L 31/08 (2006.01); H01L 31/0264 (2006.01);
U.S. Cl.
CPC ...
G01T 1/241 (2013.01); G01T 1/24 (2013.01); H01L 31/0264 (2013.01); H01L 31/085 (2013.01);
Abstract
Methods and devices for detecting incident radiation, such as incident X-rays, gamma-rays, and/or alpha particle radiation are provided. The methods and devices use high purity, high quality single-crystals of inorganic semiconductor compounds, including solid solutions, having the formula ABX, where A represents Tl or In, B represents Sn or Pb, and X represents Br or I, as photoelectric materials.