The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Aug. 27, 2019
Hitachi-lg Data Storage, Inc., Tokyo, JP;
Toshimasa Kamisada, Tokyo, JP;
Kozo Masuda, Tokyo, JP;
Hisataka Sugiyama, Tokyo, JP;
Toshimichi Shintani, Tokyo, JP;
HITACHI-LG DATA STORAGE, INC., Tokyo, JP;
Abstract
A distance measurement image pickup apparatus has two measurement periods. In a first distance measurement period, short pulsed light (1T) is irradiated, and exposure is performed in a plurality of exposure periods (A, B, and C) in which exposure timings are shifted. In each exposure period, an exposure gate is opened a plurality of times to perform repetitive exposure, and a first non-exposure period is provided from when a last exposure gate is closed until subsequent pulsed light is irradiated. In a second distance measurement period, long pulsed light (4T) is irradiated, and exposure is performed in a plurality of exposure periods (A, B, and C) in which exposure timings are shifted. In each exposure period, exposure is performed by opening the exposure gate only once, and a second non-exposure period is provided from when a last exposure gate is closed until subsequent pulsed light is irradiated.