The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Sep. 16, 2021
Fujitsu Limited, Kawasaki, JP;
Minoru Hoshina, Kawasaki, JP;
Jun Fujisaki, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A measurement apparatus acquires actually-measured closed magnetic path curve data, actually-measured open magnetic path curve data, and a surface magnetic property value; calculates, for each divided region obtained by sectioning and dividing the permanent magnet, by using a function including a parameter that determines distribution of magnetic property of the permanent magnet, a magnetic property value of the divided region based on an internal magnetic property value extracted from the actually-measured closed magnetic path curve data and the surface magnetic property value; calculates estimated open magnetic path curve data indicating a magnetization curve of the permanent magnet, based on a magnetic property value and the actually-measured closed magnetic path curve data; changes a value of the parameter to minimize a magnetization difference between the actually-measured open magnetic path curve data and the estimated open magnetic path curve data; and outputs a magnetic property value of each of the divided regions.