The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

May. 20, 2019
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventor:

Fabrice Auzanneau, Massy, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/11 (2006.01);
U.S. Cl.
CPC ...
G01R 31/11 (2013.01);
Abstract

A reflectometry system for analyzing faults in a transmission line, a reference signal being generated, in an initial step, and injected in the transmission line, the system includes a device (CPL) for acquiring the analog signal back-propagated in the transmission line, an equalization circuit (EGA) configured for equalizing the amplitudes obtained on the reflectogram for the peaks of the injected signal after its point of injection into the transmission line and of the signal reflected on the end of the transmission line, a binarization device (B) for converting the back-propagated analog signal into a signal digitized over two quantization levels, a correlator (COR) configured for correlating the digitized signal with the reference signal in order to produce a time-domain reflectogram, a module for analyzing the time-domain reflectogram in order to identify the presence of faults in the transmission line.


Find Patent Forward Citations

Auzanneau, Fabrice. (2022). Binary reflectometry system for analyzing faults in a transmission line (U.S. Patent No. 11531052). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11531052

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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