The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Jul. 20, 2018
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventor:

Ting Guo, Davis, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/542 (2006.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 33/542 (2013.01); G01N 23/223 (2013.01);
Abstract

Provided herein are methods and materials that allow targeting and imaging of interactions between probes and targets. In some embodiments, the probes include nanoscale materials with embedded solutions that can be used to measure physical enhancement by materials under X-ray irradiation. In some embodiments, the methods of the present invention include delivering a probe material to a target that can have a delivered donor material. In some embodiments, methods of the present invention include irradiating the target and determining an optical change in the probe characteristic of a physical enhancement.


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