The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Mar. 30, 2021
Applicant:

Universitat Stuttgart, Stuttgart, DE;

Inventors:

Klaus Körner, Berlin, DE;

Alois M. Herkommer, Aalen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/45 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/45 (2013.01); A61B 5/0075 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/0638 (2013.01);
Abstract

Fourier Transformation Spectrometer, FT Spectrometer, comprising: A double beam interferometer, comprising: At least one beam splitter unit () for splitting an incident light beam (EB) of a spatially expanded object into a first partial beam (TB) and a second partial beam (TB); at least a first beam deflection unit () designed to deflect the first partial beam (TB) at least a first and a second time, wherein the second beam deflection unit () is designed to also deflect the second partial beam (TB) at least at first and a second time; or the double beam interferometer comprises a second beam deflection unit () designed to deflect the second partial beam (TB) at least a first and a second time, wherein the beam deflection unit is also designed to at least partially spatially overlay the first partial beam (TB) and the second partial beam (TB), and the respectively first and second deflection of the first partial beam (TB) and of the second partial beam (TB) generates a lateral shear (s); at least a first field of view discriminator unit (BFD) arranged such that the first partial beam (TB) is spatially selected after the splitting and prior to the second deflection; at least a second field of view discriminator unit (BFD) arranged such that the second partial beam (TB) is spatially selected after the splitting and prior to the second deflection.


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