The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2022
Filed:
Sep. 14, 2018
Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E.v., Munich, DE;
Ludwig-maximilians-universitaet Muenchen, Munich, DE;
Ferenc Krausz, Garching, DE;
Ioachim Pupeza, Tuerkenfeld, DE;
Mihaela Zigman Kohlmaier, Munich, DE;
Marinus Huber, Munich, DE;
Max-Planck-Fesellschaft zur Foerderung der Wissenschaften e.V., Munich, DE;
Ludwig-Maximilians-Universitaet Muenchen, Munich, DE;
Abstract
A particle analysis method and apparatus, including a spectrometry-based analysis of a fluid sample (), comprises the steps of creating a sample light beam S and a probe light beam P with a light source device () and periodically varying a relative phase between the sample and probe light beams S, P with a phase modulator device (), irradiating the fluid sample () with the sample light beam S, detecting the sample and probe light beams S, P with a detector device (), and providing a spectral response of the at least one particle (), wherein the light source device () comprises at least one broadband source, which has an emission spectrum covering a mid-infrared MIR frequency range, and the phase modulator device () varies the relative phase with a scanning period equal to or below the irradiation period of irradiating the at least one particle ().