The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Aug. 24, 2020
Applicant:

Dalian University of Technology, Dalian, CN;

Inventors:

Daoman Han, Dalian, CN;

Yongxin Liu, Dalian, CN;

Fei Gao, Dalian, CN;

Zigeng Liu, Dalian, CN;

Zhenguo Jing, Dalian, CN;

Younian Wang, Dalian, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/32 (2021.01); G01J 3/28 (2006.01); G01K 1/14 (2021.01);
U.S. Cl.
CPC ...
G01K 11/32 (2013.01); G01J 3/28 (2013.01); G01K 1/14 (2013.01);
Abstract

The present invention discloses a device for measuring gas temperature in plasma, including: a vacuum chamber, a fiber optic temperature sensor, a quartz tube, a circulator, a spectrometer, a broadband light source and a computer. One end of the quartz tube is inserted into the vacuum chamber. The fiber optic temperature sensor is located in the plasma in the vacuum chamber and fixed to the quartz tube. The fiber optic temperature sensor is connected to the circulator by means of an optical fiber passing through the quartz tube. The circulator is connected to the broadband light source and the spectrometer through optical fibers, respectively. The spectrometer is electrically connected to the computer which is configured to read and record spectra collected by the spectrometer.


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