The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Mar. 13, 2018
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Kentaro Goto, Hamamatsu, JP;

Toyohiko Yamauchi, Hamamatsu, JP;

Hidenao Yamada, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); C12Q 1/24 (2006.01); G01N 1/28 (2006.01); G01N 15/06 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
C12Q 1/24 (2013.01); G01N 1/2813 (2013.01); G01N 15/06 (2013.01); G06T 7/0014 (2013.01); G01N 2015/0693 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An evaluation method is a method for evaluating a cell mass containing a plurality of aggregated cells, and includes an imaging step of capturing an image of light obtained from the cell mass by irradiating the cell mass with light, an analysis step of setting a reference point for the cell mass included in image data obtained by the imaging step, setting sampling circles centered on the reference point, and determining a parameter for a state of the cell mass based on image data included in regions on the sampling circles, and an evaluation step of evaluating the cell mass based on the parameter.


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