The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Feb. 20, 2020
Applicant:

Kci Licensing, Inc., San Antonio, TX (US);

Inventors:

James Seddon, Wimborne, GB;

Benjamin A. Pratt, Poole, GB;

Assignee:

KCI Licensing, Inc., San Antonio, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61M 1/00 (2006.01);
U.S. Cl.
CPC ...
A61M 1/90 (2021.05); A61M 2205/15 (2013.01); A61M 2205/18 (2013.01); A61M 2205/3306 (2013.01); A61M 2205/3327 (2013.01); A61M 2205/505 (2013.01); A61M 2205/8212 (2013.01);
Abstract

One implementation of the present disclosure is a method for dynamically controlling an alarm of a negative pressure wound therapy (NPWT) device, according to some embodiments. In some embodiments, the method includes initiating NPWT, comparing an initial pump duty to a threshold value to determine a dressing application quality, monitoring a leakage rate of the NPWT, setting a leak threshold value based on the dressing application quality, determining leakage event occurrences in response to the leakage rate exceeding the leak threshold value at multiple times, adjusting the leak threshold value based on at least one of a number of the leakage events over the time period, a time duration between sequentially occurring leakage events of the leakage events, and the dressing application quality, and causing a user interface device to display a leak alert in response to the leakage rate exceeding the adjusted leak threshold value.


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