The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Oct. 24, 2019
Applicant:

Lincoln Diagnostics, Inc., Decatur, IL (US);

Inventors:

Gary L. Hein, Jr., Decatur, IL (US);

Douglas S. Hein, Decatur, IL (US);

Assignee:

Lincoln Diagnostics, Inc., Decatur, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/411 (2013.01); A61B 5/445 (2013.01);
Abstract

An allergy testing system comprises a skin test device having a grip portion for holding the device. One or more legs extend from the grip, and each leg is oriented to interact with a well containing a potential allergen. Each leg has a test head, and each test head has a plurality of elongated spike members. The elongated spike members have a sharp end configured to receive the potential allergen from a well and to puncture a patient's skin. In addition, each test head has a touch activator. The touch activator is longer than the plurality of elongated spike members, such that during an allergy test, the touch activator comes into contact with the skin prior to the elongated spike members, causing the touch activator to activate nerve tissue that blocks transmission of pain, resulting in a reduction of pain and/or discomfort during testing.


Find Patent Forward Citations

Hein, Jr., Gary. (2022). Allergy testing device and method of testing for allergies (U.S. Patent No. 11529092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11529092

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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