The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jan. 15, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Ian Ernan Liu, Shenzhen, CN;

Carlo Murgia, Santa Clara, CA (US);

Huiqun Han, Shenzhen, CN;

Zhouhui Miao, Saratoga, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); G10L 25/21 (2013.01); G10L 25/51 (2013.01); H04R 3/00 (2006.01); G10L 15/22 (2006.01); H04R 1/40 (2006.01); G10L 25/18 (2013.01);
U.S. Cl.
CPC ...
H04R 29/005 (2013.01); G10L 15/22 (2013.01); G10L 25/18 (2013.01); G10L 25/21 (2013.01); G10L 25/51 (2013.01); H04R 1/406 (2013.01); H04R 3/005 (2013.01);
Abstract

A system configured to perform microphone occlusion event detection. When a device detects a microphone occlusion event, the device will modify audio processing performed prior to speech processing, such as by disabling spatial processing and only processing audio data from a single microphone. The device detects the microphone occlusion event by determining inter-level difference (ILD) values between two microphone signals and using the ILD values as input features to a classifier. For example, when a far-end reference signal is inactive, the classifier may process a first ILD value within a high frequency band. However, when the far-end reference signal is active, the classifier may process the first ILD value and a second ILD value within a low frequency band.


Find Patent Forward Citations

Loading…