The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jun. 15, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Min-woo Park, Yongin-si, KR;

Bo-ra Jin, Yongin-si, KR;

In-kwon Choi, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/44 (2014.01); H04N 19/105 (2014.01); H04N 19/117 (2014.01); H04N 19/132 (2014.01); H04N 19/159 (2014.01); H04N 19/172 (2014.01); H04N 19/136 (2014.01); H04N 19/176 (2014.01); H04N 19/593 (2014.01);
U.S. Cl.
CPC ...
H04N 19/44 (2014.11); H04N 19/105 (2014.11); H04N 19/117 (2014.11); H04N 19/132 (2014.11); H04N 19/159 (2014.11); H04N 19/172 (2014.11); H04N 19/136 (2014.11); H04N 19/176 (2014.11); H04N 19/593 (2014.11);
Abstract

Provided is a method of decoding an image, the method including: determining at least one prediction unit included in a current frame that is one of at least one frame forming the image; determining a reference region to be referred to by a current prediction unit that is one of the at least one prediction unit; changing a sample value included in at least one of the current prediction unit and the reference region, based on an analyzing result of a sample value of the reference region; determining a sample value included in the current prediction unit, based on a result of changing the sample value; and decoding the image based on the determined sample value of the current prediction unit.


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