The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jan. 14, 2020
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Yacong Ding, San Diego, CA (US);

Hyukjoon Kwon, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 27/26 (2006.01); H04L 25/02 (2006.01); H04B 1/7113 (2011.01);
U.S. Cl.
CPC ...
H04L 27/2665 (2013.01); H04B 1/7113 (2013.01); H04L 25/0202 (2013.01); H04L 27/2675 (2013.01);
Abstract

Methods and an apparatus are provided. A first method includes receiving an estimated first arrival path (FAP); processing the estimated FAP; providing a rounding operation on the processed estimated FAP to generate an adjustment value for adjusting a fast Fourier transform (FFT) window; determining a quantization error based on the processed estimated FAP; and summing the quantization error to the processed estimated FAR A second method includes receiving an estimated FAP; determining a weighted average of the estimated FAP; processing the weighted average of the estimated FAP; providing a rounding operation on the processed weighted average of the estimated FAP to generate an adjustment value for adjusting an FFT window; determining a delayed STR adjustment based on the processed weighted average of the estimated FAP in a previous time slot; and summing the delayed STR adjustment to the processed weighted average of the estimated FAP in a current time slot.


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