The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Mar. 17, 2021
Applicant:

Innogrit Technologies Co., Ltd., Shanghai, CN;

Inventors:

Han Zhang, San Jose, CA (US);

Chenrong Xiong, San Jose, CA (US);

Jie Chen, Milpitas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/39 (2006.01); H03K 19/17728 (2020.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/3927 (2013.01); H03K 19/17728 (2013.01); H03M 13/1117 (2013.01); H03M 13/1145 (2013.01);
Abstract

Systems and methods are provided for performing error recovery using LLRs generated from multi-read operations. A method may comprise selecting a set of decoding factors for a multi-read operation to read a non-volatile storage device multiple times. The set of decoding factors may include a total number of reads, an aggregation mode for aggregating read results of multiple reads, and whether the read results include soft data. The method may further comprise issuing a command to the non-volatile storage device to read user data according to the set of decoding factors, generating a plurality of Log-Likelihood Ratio (LLR) values using a mapping engine from a pre-selected set of LLR value magnitudes based on the set of decoding factors, obtaining an aggregated read result in accordance with the aggregation mode and obtaining an LLR value from the plurality of LLR values using the aggregated read result as an index.


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