The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Nov. 23, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Norihiko Nakata, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/32 (2006.01); F21V 3/00 (2015.01); F21S 43/145 (2018.01); F21S 43/20 (2018.01); H04N 5/232 (2006.01); G06F 3/01 (2006.01); H01L 51/52 (2006.01); F21Y 115/15 (2016.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
H01L 27/322 (2013.01); F21S 43/145 (2018.01); F21S 43/26 (2018.01); F21V 3/00 (2013.01); G06F 3/013 (2013.01); H01L 51/5246 (2013.01); H04N 5/23293 (2013.01); F21Y 2115/15 (2016.08); G02B 5/201 (2013.01);
Abstract

A semiconductor device includes a first substrate, a semiconductor device includes a first substrate, a color filter layer over the first substrate in an effective pixel region, a second substrate over the color filter layer, a joint member joining the first and second substrates, and a pattern layer over the first substrate outside the effective pixel region. The color filter layer has a color filter material and the pattern layer has the color filter material. In a planar view with respect to a surface of the first substrate on which the joint member is disposed, the pattern layer is disposed between two portions of the joint member, the two portions being separate from and adjacent to each other. In the planar view, the joint member is not disposed between the pattern layer and an end of the first substrate closest to the pattern layer among ends of the first substrate.


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