The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jul. 23, 2020
International Business Machines Corporation, Armonk, NY (US);
Emanuel Marc Löertscher, Bonstetten, CH;
Gero Dittmann, Zürich, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method interpret optical characterization examinations performed with a set of optical devices. Each device comprises one or more arrays of optical metasurface structures and have arrays tailored to have distinct properties making them differ from one another. First data and second data are accessed that capture a physical fingerprint of each device and an outcome of an optical characterization examination performed with each device, respectively. The outcomes of examinations performed are impacted by the respective, distinct properties of the arrays. Each device is identified based on the first data accessed, which makes it possible to obtain a readout key associated with the identified device. This readout key accounts for the respective one of the distinct properties. Finally, the second data are interpreted according to the readout key obtained to elucidate the outcome of the optical characterization examination. The invention is further directed to related computer program products.