The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Jan. 10, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Wataru Takeuchi, Tokyo, JP;

Takuma Shibahara, Tokyo, JP;

Ken Naono, Tokyo, JP;

Shinji Tarumi, Tokyo, JP;

Shuntaro Yui, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 3/02 (2006.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 3/02 (2013.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01);
Abstract

An analysis apparatus comprises: a generation module configured to generate a second piece of input data having a weight for a first feature item of a patient based on: a first piece of input data relating to the first feature item; a second feature item relating to a transition to a prediction target in a clinical pathway relating to a process for diagnosis or treatment; and a clinical terminology indicating relevance between medical terms; a neural network configured to output, when being supplied with the first piece of input data and the second piece of input data generated, a prediction result for the prediction target in the clinical pathway and importance of the first feature item; an edit module configured to edit the clinical pathway based on the prediction result and the importance output from the neural network; and an output module configured to output an edit result.


Find Patent Forward Citations

Quick Actions:

Takeuchi, Wataru. (2022). Analysis apparatus and analysis method (U.S. Patent No. 11527325). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11527325

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…