The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jun. 02, 2020
Hitachi, Ltd., Tokyo, JP;
Toru Shirai, Tokyo, JP;
Ryota Satoh, Tokyo, JP;
Yasuo Kawata, Tokyo, JP;
Tomoki Amemiya, Tokyo, JP;
Yoshitaka Bito, Tokyo, JP;
Hisaaki Ochi, Tokyo, JP;
FUJIFILM HEALTHCARE CORPORATION, Chiba, JP;
Abstract
In brain analysis, anatomical standardization is performed when analyzing a region of interest (ROI). There are individual differences in the shape and size of the brain and by converting the brain into a standard brain, these differences can be compared with each other and subjected to statistical analysis. When generating a standard brain analysis, a large number of pieces of image data are classified into a plurality of groups based on their anatomical features. An intermediate template that is an intermediate conversion image and a conversion map is calculated for each group, and the calculation of the intermediate template and the generation of the intermediate conversion image are repeated while gradually reducing the number of classifications, so that a final standard image is generated. Using the standard image and the intermediate template calculated during the generation of the standard image, spatial standardization of the measured image is performed.