The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Dec. 07, 2018
Electricite DE France, Paris, FR;
Centre National DE LA Recherche Scientifique (Cnrs), Paris, FR;
Ecole Normale Superieure DE Cachan, Cachan, FR;
Félix Latourte, Cherbourg, FR;
Qiwei Shi, Shanghai, CN;
François Hild, Chatenay Malabry, FR;
Stéphane Roux, Rosny-Sous-Bois, FR;
Abstract
The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E, E), a current elastic deformation gradient tensor Fis given a value determined by calculation, during a second step (E), the current displacement field induced by the tensor Fis calculated, during a third step (E), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E, E, E) are carried out on modified values of the tensor r Funtil a convergence criterion is met in relation to the correction to the current value of F.