The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Feb. 28, 2020
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Le Song, Hangzhou, CN;
Hui Li, Hangzhou, CN;
Zhibang Ge, Hangzhou, CN;
Xin Huang, Hangzhou, CN;
Chunyang Wen, Hangzhou, CN;
Lin Wang, Hangzhou, CN;
Tao Jiang, Hangzhou, CN;
Yiguang Wang, Hangzhou, CN;
Xiaofu Chang, Hangzhou, CN;
Guanyin Zhu, Hangzhou, CN;
Advanced New Technologies Co., Ltd., Grand Cayman, KY;
Abstract
A graphical structure model trained by using labeled samples is obtained. The graphical structure model is defined based on an enterprise relationship network that includes nodes and edges. Each labeled sample includes a label indicating whether a corresponding node is a risky credit node. The graphical structure model is configured to iteratively calculate an embedding vector of at least one node in a hidden feature space based on an original feature of the at least one node and/or a feature of an edge associated with the at least one node. An embedding vector corresponding to a test-sample is calculated by using the graphical structure model. Credit risk analysis is performed on the test-sample. The credit risk analysis is performed based on a feature of the test-sample represented in the embedding vector. A node corresponding to the test-sample is labeled as a credit risk node.