The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

May. 13, 2020
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Paridhi Kabra, Indore, IN;

Prateek Mishra, Ghaziabad, IN;

Jingying Zhang, Beaumont, TX (US);

Nitin Kapoor, Kota, IN;

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06N 20/00 (2019.01); G06Q 50/28 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06375 (2013.01); G06N 20/00 (2019.01); G06Q 10/067 (2013.01); G06Q 50/28 (2013.01);
Abstract

Systems and methods for determining whether a particular feature or change implemented in at least one test store causes a significant change as compared to one or more control stores are discussed. More particularly, techniques for using a time-series clustering algorithm to identify comparable sister stores to a store in which a feature change is being considered are described. Once the sister stores are identified a testing module can perform an A/B testing so as to validate whether a particular feature change being implemented in the test store causes a significant change as compared to the control stores.


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